Wafer Level Optical Test

This system is an industrial Automatic Test Equipment for Wafer Level Optics (WLO) applications. The equipment performs optical tests like: standard MTF measurement, ultra fast flange focal length, complex pattern analysis.

Destination market: Telecommunications - Consumer Electronics

DUT Type: Wafer Level and microcamera

DUT Description: Diffractive Optical Element (DOE), Decorative Lighting - Micro Lens Array (MLA), Wafer Level Lens, Thermal imaging cameras

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