This system is an industrial Automatic Test Equipment for Wafer Level Optics (WLO) applications. The equipment performs optical tests like: standard MTF measurement, ultra fast flange focal length, complex pattern analysis.
Destination market: Telecommunications - Consumer Electronics
DUT Type: Wafer Level and microcamera
DUT Description: Diffractive Optical Element (DOE), Decorative Lighting - Micro Lens Array (MLA), Wafer Level Lens, Thermal imaging cameras